Cables—the nemesis of compliance, the antennas no one wants—often are the culprits or unwanted stepchildren in EMC testing. Controlling conducted emissions is an inherent problem that requires ...
Electronics design and testing were once two distinct functions where an electronic design was breadboarded and populated ...
The use of redundant logic may increase product reliability. Two of the most costly functions that engineering teams developing electronic products perform are verification and test. On the surface, ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...
As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...
The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
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