Image data fusion of SIMS and TOF-SIMS with a high spatial resolution is helpful to obtain a clearer score image by PCA. An image data fusion of SIMS and TOF-SMS in high spatial and mass resolution ...
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly sensitive surface analysis technique that provides elemental, chemical state, and molecular information from solid material ...
A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
Stephan, T., Rost, D., Vicenzi, Edward P., Bullock, Emma S., MacPherson, Glenn J., Westphal, A. J., Snead, C. J., Flynn, G. J., Sandford, S. A., and Zolensky, M. E ...
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