Not every die-inspection problem succumbs to emission microscopy. But more of today’s backside challenges are disappearing as CAD navigation software and the microscope join forces. Emission ...

As PCB hybrid manufacturing makes greater inroads with microelectronics manufacturing, new inspection tools are coming to the fore. In our industry, microelectronics manufacturing is increasingly ...

Acoustic microscope imaging is commonly used along with x-ray inspection during semiconductor production and failure analysis to reveal internal flaws such as cracks and voids. Until recently, however ...

Some industry sectors such as automotive and medical continue to push for higher and higher reliability levels; however, many fabs are having difficulties achieving them. Current inspection regimes ...

This article describes a six-inch wafer inspection microscope that provides automated, reproducible differential interference contrast (DIC) imaging, regardless of the user’s skill level. Wafer ...

When using a measurement microscope, users can measure the size and dimensions of sample features in both two and three dimensions, which is important for inspection, quality control (QC), failure ...