Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...
What is Atom Probe Tomography? Atom Probe Tomography (APT) is a powerful analytical technique that provides three-dimensional (3D) imaging and chemical composition analysis of materials at the atomic ...
Researchers at the California NanoSystems Institute at UCLA published a step-by-step framework for determining the three-dimensional positions and elemental identities of atoms in amorphous materials.
Scientists at the Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab) have developed a new way to determine atomic structures from nanocrystals previously considered unusable, ...
Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...
They applied the 2017 Nobel Prize-winning 3D structural analysis method for protein particles to solve a long-standing challenge. (Nanowerk News) Seoul National University College of Engineering ...
A new technical paper, “3D atomic-scale metrology of strain relaxation and roughness in Gate-All-Around transistors via electron ptychography,” was published by researchers at Cornell University, ASM ...
The X-ray Laboratory of Rigaku Corporation, a Rigaku Holdings Group company and a global solution partner for X-ray analysis (headquarters: Akishima, Tokyo; president and CEO: Jun Kawakami; “Rigaku”), ...
High-resolution atomic-level analysis revealed a total of 1,534 atoms (591 Ni and 943 Pt) within the NiPt-SP nanocatalyst. Local atomic arrangement analysis demonstrated that a significant portion of ...
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